Pulse Instruments is a world leader in flexible test electronics for FPAs, ROICs, CCDs, and visible CMOS imagers. PI systems combine the convenience of "push button" radiometric testing with the flexibility to define any test for nearly any FPA or ROIC on the market, while providing the low-noise performance that's been our hallmark since 1974.
Shown here, at the II-VI Materials Workshop, is a small, transportable system running an uncooled microbolometer FPA, with fully corrected, real-time imaging on the monitor. Systems can be programmed to run cooled or uncooled detectors in MCT, InSb, InGaAs, QWIP, T2SL, PbSe, VOx, aSi, or materials yet to be engineered.
Our software supports integration with blackbody and visible sources from SBIR, CI Systems, EOI, and Inframet for fully automated radiometric characterization and production test.
2024 II-VI Workshop Abstract Due Date | May 20 |
2024 II-VI Workshop Accept/Reject Notification | Jun 14 |
2024 II-VI Workshop Late-News Abstract Deadline | June 21 |
2024 II-VI Workshop Extended Abstract Deadline | July 26 |
2024 Hotel Reservation Deadline | Aug 28 |
2024 II-VI Workshop Adv. Registration Deadline | Sep 9 |
JEM Paper Submission Deadline | Oct 30 - Nov 29 |
2024 II-VI Workshop | Sep 30 - Oct 3 |